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General
Semiconductor Strain Gauges
Semiconductor strain gages are devices which
vary in resistance as strain is applied to them. This property makes
them very useful in measuring extremely small amounts of force with
accuracy and precision. Creative uses for these gages have ranged
from the measurement of internal pressures inside solid rocket engines
to delicate medical apparatus used in microsurgery.
Gages made from semiconductor materials have
advantages over more conventional types of strain gages. These include
homogeneity, increased “sensitivity”, and decreased
size. |
Semiconductor Standard Gages
» "Bar" Semiconductor Strain Gages
»
"U" - Shaped Semiconductor
Strain Gages
» "M" - Shaped Semiconductor Strain Gages
|
» Semiconductor Backed Gages
Mounted on a flexible insulated
circuit with versatile solder pads makes them easy to install.
They
can be bent without hurting the gage and will perform like a foil
gage except that the sensitivity change is 50 to 75 times greater.
On load cells and foil bridges,
when it is used as a linearity corrector, a non-linearity of 0.125 %
FS can be corrected to within .01 % of full scale. Long-term
stability is not compromised. Backed gages are suggested for use in
prototyping for proof of concept and for transient or high frequency
measurements.
Backed gages are not suggested
for use when used in a full or half bridge when precision long term
stability is a requirement. Un-backed gages that are closely matched
are suggested for these applications. |
Micron
Instruments offers a range of
semiconductor backed half bridge strain gages. The gages are installed
on a flexible insulated circuit with easy to solder pads which can be
bent without hurting the gage and will perform like a foil gage except
that the resistive change is 30 to 55 times greater. |
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